%0 Conference Paper %1 conf/ats/OshimaKWSK18 %A Oshima, Shigeyuki %A Kato, Takaaki %A Wang, Senling %A Sato, Yasuo %A Kajihara, Seiji %B ATS %D 2018 %I IEEE %K dblp %P 30-35 %T On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST. %U http://dblp.uni-trier.de/db/conf/ats/ats2018.html#OshimaKWSK18 %@ 978-1-5386-9466-4

@inproceedings{conf/ats/OshimaKWSK18, added-at = {2023-03-24T00:00:00.000+0100}, author = {Oshima, Shigeyuki and Kato, Takaaki and Wang, Senling and Sato, Yasuo and Kajihara, Seiji}, biburl = {https://www.bibsonomy.org/bibtex/254036986134bbf095afc80141d9a90fa/dblp}, booktitle = {ATS}, crossref = {conf/ats/2018}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2018.00017}, interhash = {b1cf49a7df441b45641c2678799b5d68}, intrahash = {54036986134bbf095afc80141d9a90fa}, isbn = {978-1-5386-9466-4}, keywords = {dblp}, pages = {30-35}, publisher = {IEEE}, timestamp = {2024-04-10T06:36:39.000+0200}, title = {On Flip-Flop Selection for Multi-cycle Scan Test with Partial Observation in Logic BIST.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2018.html#OshimaKWSK18}, year = 2018 }