%0 Journal Article %1 journals/mr/YunYJKPC04 %A Yun, Se Re Na %A Yu, Chong-Gun %A Jeon, Seok Hee %A Kim, Chungkyue %A Park, Jong Tae %A Colinge, Jean-Pierre %D 2004 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1649-1654 %T Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's. %U http://dblp.uni-trier.de/db/journals/mr/mr44.html#YunYJKPC04 %V 44

@article{journals/mr/YunYJKPC04, added-at = {2022-10-02T00:00:00.000+0200}, author = {Yun, Se Re Na and Yu, Chong-Gun and Jeon, Seok Hee and Kim, Chungkyue and Park, Jong Tae and Colinge, Jean-Pierre}, biburl = {https://www.bibsonomy.org/bibtex/25e628f1ca2dd8afa2a5dcca41229757c/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.07.085}, interhash = {b1ed79a5b4f64ef4e57dde7342683478}, intrahash = {5e628f1ca2dd8afa2a5dcca41229757c}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1649-1654}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Reduced Hot Carrier Effects in Self-Aligned Ground-Plane FDSOI MOSFET's.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr44.html#YunYJKPC04}, volume = 44, year = 2004 }