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Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG.
R. Richter, S. Dünkel, B. Müller, F. Mauersberger, S. Wittek, S. Beyer, J. Böhme, U. Ritter, V. Sessi, Z. Xu, M. Drescher, J. Kim, P. Ghazavi, Y. Tkachev, L. Tee, Z. Li, M. Tadayoni, F. Luo, N. Do, S. Jourba, C. Decobert, G. Festes, B. Villard, und T. Pate-Cazal.IMW, Seite 1-4. IEEE, (2024)
Metadaten
- BibTeX-Schlüssel
- conf/imw2/RichterDMMWBBRSXDKGTTLTLDJDFVP24
- Eintragstyp
- inproceedings
- Buchtitel
- IMW
- Jahr
- 2024
- Seiten
- 1-4
- Verlag
- IEEE
- BibTeX-Querverweis
- conf/imw2/2024
- ee
- https://doi.org/10.1109/IMW59701.2024.10536960
- isbn
- 979-8-3503-0652-1
- URL
- http://dblp.uni-trier.de/db/conf/imw2/imw2024.html#RichterDMMWBBRSXDKGTTLTLDJDFVP24
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%1 conf/imw2/RichterDMMWBBRSXDKGTTLTLDJDFVP24
%A Richter, Ralf
%A Dünkel, Stefan
%A Müller, Bert
%A Mauersberger, Frank
%A Wittek, Sven
%A Beyer, Sven
%A Böhme, Jana
%A Ritter, Uwe
%A Sessi, Violetta
%A Xu, Zhen
%A Drescher, Maximilian
%A Kim, Jinho
%A Ghazavi, Parviz
%A Tkachev, Yuri
%A Tee, Latt
%A Li, Zonglin
%A Tadayoni, Mandana
%A Luo, Fan
%A Do, Nhan
%A Jourba, Serguei
%A Decobert, Catherine
%A Festes, Gilles
%A Villard, Bruno
%A Pate-Cazal, Thibaut
%B IMW
%D 2024
%I IEEE
%K dblp
%P 1-4
%T Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG.
%U http://dblp.uni-trier.de/db/conf/imw2/imw2024.html#RichterDMMWBBRSXDKGTTLTLDJDFVP24
%@ 979-8-3503-0652-1
@inproceedings{conf/imw2/RichterDMMWBBRSXDKGTTLTLDJDFVP24,
added-at = {2024-06-10T00:00:00.000+0200},
author = {Richter, Ralf and Dünkel, Stefan and Müller, Bert and Mauersberger, Frank and Wittek, Sven and Beyer, Sven and Böhme, Jana and Ritter, Uwe and Sessi, Violetta and Xu, Zhen and Drescher, Maximilian and Kim, Jinho and Ghazavi, Parviz and Tkachev, Yuri and Tee, Latt and Li, Zonglin and Tadayoni, Mandana and Luo, Fan and Do, Nhan and Jourba, Serguei and Decobert, Catherine and Festes, Gilles and Villard, Bruno and Pate-Cazal, Thibaut},
biburl = {https://www.bibsonomy.org/bibtex/2daa867e2097eac2370915fd357414079/dblp},
booktitle = {IMW},
crossref = {conf/imw2/2024},
ee = {https://doi.org/10.1109/IMW59701.2024.10536960},
interhash = {b367fab5082645e9b068e36a371ac056},
intrahash = {daa867e2097eac2370915fd357414079},
isbn = {979-8-3503-0652-1},
keywords = {dblp},
pages = {1-4},
publisher = {IEEE},
timestamp = {2024-06-17T07:42:02.000+0200},
title = {Performance and Reliability of Technology Qualified 34 Mb Split-Gate eFLASH Macro in 28 nm HKMG.},
url = {http://dblp.uni-trier.de/db/conf/imw2/imw2024.html#RichterDMMWBBRSXDKGTTLTLDJDFVP24},
year = 2024
}