%0 Conference Paper %1 conf/3dic/KonishiYH11 %A Konishi, Tomoaki %A Yotsuyanagi, Hiroyuki %A Hashizume, Masaki %B 3DIC %D 2011 %E Koyanagi, Mitsumasa %E Kada, Morihiro %I IEEE %K dblp %P 1-6 %T Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture. %U http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#KonishiYH11 %@ 978-1-4673-2189-1

@inproceedings{conf/3dic/KonishiYH11, added-at = {2017-05-21T00:00:00.000+0200}, author = {Konishi, Tomoaki and Yotsuyanagi, Hiroyuki and Hashizume, Masaki}, biburl = {https://www.bibsonomy.org/bibtex/22612a3e4667a347f32312008ffbb5e23/dblp}, booktitle = {3DIC}, crossref = {conf/3dic/2011}, editor = {Koyanagi, Mitsumasa and Kada, Morihiro}, ee = {https://doi.org/10.1109/3DIC.2012.6262968}, interhash = {b4a3d762d06c5c1617faefcba6e23ae4}, intrahash = {2612a3e4667a347f32312008ffbb5e23}, isbn = {978-1-4673-2189-1}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T15:31:14.000+0200}, title = {Supply current testing of open defects at interconnects in 3D Ics with IEEE 1149.1 architecture.}, url = {http://dblp.uni-trier.de/db/conf/3dic/3dic2011.html#KonishiYH11}, year = 2011 }