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%0 Conference Paper
%1 conf/icecsys/ParkLRKSB10
%A Park, Sangku
%A Lee, Jaehoon
%A Ryu, Y.
%A Kang, J.
%A So, B.
%A Baek, Dohyun
%B ICECS
%D 2010
%I IEEE
%K dblp
%P 289-292
%T Gate oxide trap characterization under DC and pulse stress.
%U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2010.html#ParkLRKSB10
%@ 978-1-4244-8155-2
@inproceedings{conf/icecsys/ParkLRKSB10,
added-at = {2017-05-23T00:00:00.000+0200},
author = {Park, Sangku and Lee, Jaehoon and Ryu, Y. and Kang, J. and So, B. and Baek, Dohyun},
biburl = {https://www.bibsonomy.org/bibtex/2820003355543af880e433765233a5f42/dblp},
booktitle = {ICECS},
crossref = {conf/icecsys/2010},
ee = {https://doi.org/10.1109/ICECS.2010.5724510},
interhash = {babef0bde15096215c1df26f3d57aca4},
intrahash = {820003355543af880e433765233a5f42},
isbn = {978-1-4244-8155-2},
keywords = {dblp},
pages = {289-292},
publisher = {IEEE},
timestamp = {2019-10-17T19:54:23.000+0200},
title = {Gate oxide trap characterization under DC and pulse stress.},
url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2010.html#ParkLRKSB10},
year = 2010
}