%0 Conference Paper %1 conf/inss/HayekSB10 %A Hayek, Ali %A Schreiber, Michael %A Börcsök, Josef %B INSS %D 2010 %I IEEE %K dblp %P 41-44 %T Basic VHDL tests conforming to IEC 61508. %U http://dblp.uni-trier.de/db/conf/inss/inss2010.html#HayekSB10 %@ 978-1-4244-7910-8

@inproceedings{conf/inss/HayekSB10, added-at = {2017-05-19T00:00:00.000+0200}, author = {Hayek, Ali and Schreiber, Michael and Börcsök, Josef}, biburl = {https://www.bibsonomy.org/bibtex/2d23649e0eed34d7b2da6a176b275bd7f/dblp}, booktitle = {INSS}, crossref = {conf/inss/2010}, ee = {https://doi.org/10.1109/INSS.2010.5573616}, interhash = {c317c205bf08d6e18e530c2ed5f070ae}, intrahash = {d23649e0eed34d7b2da6a176b275bd7f}, isbn = {978-1-4244-7910-8}, keywords = {dblp}, pages = {41-44}, publisher = {IEEE}, timestamp = {2019-10-17T13:27:20.000+0200}, title = {Basic VHDL tests conforming to IEC 61508.}, url = {http://dblp.uni-trier.de/db/conf/inss/inss2010.html#HayekSB10}, year = 2010 }