%0 Conference Paper %1 conf/irps/KimYKEKYLKP21 %A Kim, Gang-Jun %A Yoon, Moonjee %A Kim, SungHwan %A Eo, Myeongkyu %A Kim, Shinhyung %A You, Taehun %A Lee, Namhyun %A Kim, Kijin %A Pae, Sangwoo %B IRPS %D 2021 %I IEEE %K dblp %P 1-4 %T The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress. %U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#KimYKEKYLKP21 %@ 978-1-7281-6893-7

@inproceedings{conf/irps/KimYKEKYLKP21, added-at = {2021-05-05T00:00:00.000+0200}, author = {Kim, Gang-Jun and Yoon, Moonjee and Kim, SungHwan and Eo, Myeongkyu and Kim, Shinhyung and You, Taehun and Lee, Namhyun and Kim, Kijin and Pae, Sangwoo}, biburl = {https://www.bibsonomy.org/bibtex/23e3252d50da4ec7a9c77ebb5df12162a/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2021}, ee = {https://doi.org/10.1109/IRPS46558.2021.9405108}, interhash = {cca78ef892bf3d84a4296d1f512227f1}, intrahash = {3e3252d50da4ec7a9c77ebb5df12162a}, isbn = {978-1-7281-6893-7}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:55.000+0200}, title = {The Characterization of Degradation on various SiON pMOSFET transistors under AC/DC NBTI stress.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#KimYKEKYLKP21}, year = 2021 }