%0 Conference Paper %1 conf/eurospi/YoungW18 %A Young, Alison %A Walker, Alastair %B EuroSPI %D 2018 %E Larrucea, Xabier %E Santamaría, Izaskun %E O'Connor, Rory V. %E Messnarz, Richard %I Springer %K dblp %P 331-340 %T Qualifying Dependent Failure Analysis Within ISO26262: Applicability to Semiconductors. %U http://dblp.uni-trier.de/db/conf/eurospi/eurospi2018.html#YoungW18 %V 896 %@ 978-3-319-97925-0

@inproceedings{conf/eurospi/YoungW18, added-at = {2018-08-23T00:00:00.000+0200}, author = {Young, Alison and Walker, Alastair}, biburl = {https://www.bibsonomy.org/bibtex/22342a4ebe3693777e81f8d6e561ead00/dblp}, booktitle = {EuroSPI}, crossref = {conf/eurospi/2018}, editor = {Larrucea, Xabier and Santamaría, Izaskun and O'Connor, Rory V. and Messnarz, Richard}, ee = {https://doi.org/10.1007/978-3-319-97925-0_27}, interhash = {d5a23798bdc46c6fccb271e5b92f0d0b}, intrahash = {2342a4ebe3693777e81f8d6e561ead00}, isbn = {978-3-319-97925-0}, keywords = {dblp}, pages = {331-340}, publisher = {Springer}, series = {Communications in Computer and Information Science}, timestamp = {2024-04-09T11:35:19.000+0200}, title = {Qualifying Dependent Failure Analysis Within ISO26262: Applicability to Semiconductors.}, url = {http://dblp.uni-trier.de/db/conf/eurospi/eurospi2018.html#YoungW18}, volume = 896, year = 2018 }