%0 Journal Article %1 journals/ieicet/SawadaTYTNN12 %A Sawada, Takuya %A Toshikawa, Taku %A Yoshikawa, Kumpei %A Takata, Hidehiro %A Nii, Koji %A Nagata, Makoto %D 2012 %J IEICE Trans. Electron. %K dblp %N 4 %P 586-593 %T Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet95c.html#SawadaTYTNN12 %V 95-C

@article{journals/ieicet/SawadaTYTNN12, added-at = {2020-04-11T00:00:00.000+0200}, author = {Sawada, Takuya and Toshikawa, Taku and Yoshikawa, Kumpei and Takata, Hidehiro and Nii, Koji and Nagata, Makoto}, biburl = {https://www.bibsonomy.org/bibtex/234a653700b01583f4e9ad7bfcf4a34b1/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e95-c_4_586}, interhash = {d995107f0dfc379c960e4f97e815b916}, intrahash = {34a653700b01583f4e9ad7bfcf4a34b1}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 4, pages = {586-593}, timestamp = {2020-04-14T11:41:02.000+0200}, title = {Evaluation of SRAM-Core Susceptibility against Power Supply Voltage Variation.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet95c.html#SawadaTYTNN12}, volume = {95-C}, year = 2012 }