%0 Journal Article %1 journals/tcad/MukhopadhyayMR08 %A Mukhopadhyay, Saibal %A Mahmoodi, Hamid %A Roy, Kaushik %D 2008 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 1 %P 174-183 %T Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias. %U http://dblp.uni-trier.de/db/journals/tcad/tcad27.html#MukhopadhyayMR08 %V 27

@article{journals/tcad/MukhopadhyayMR08, added-at = {2020-10-26T00:00:00.000+0100}, author = {Mukhopadhyay, Saibal and Mahmoodi, Hamid and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/28b6b76a745913401d2c4b3d473f178b6/dblp}, ee = {https://doi.org/10.1109/TCAD.2007.906995}, interhash = {deecc38122534f55eeff4668f48a3b09}, intrahash = {8b6b76a745913401d2c4b3d473f178b6}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 1, pages = {174-183}, timestamp = {2020-10-27T12:23:45.000+0100}, title = {Reduction of Parametric Failures in Sub-100-nm SRAM Array Using Body Bias.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad27.html#MukhopadhyayMR08}, volume = 27, year = 2008 }