%0 Conference Paper %1 conf/irps/HungCCCLH21 %A che Hung, Shih %A Chen, Shih-Chang %A Chien, Pei-Shan %A Cho, Yu-Sheng %A Lee, Yung-Huei %A Hung, Wei-Shuo %B IRPS %D 2021 %I IEEE %K dblp %P 1-6 %T Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications. %U http://dblp.uni-trier.de/db/conf/irps/irps2021.html#HungCCCLH21 %@ 978-1-7281-6893-7

@inproceedings{conf/irps/HungCCCLH21, added-at = {2021-05-20T00:00:00.000+0200}, author = {che Hung, Shih and Chen, Shih-Chang and Chien, Pei-Shan and Cho, Yu-Sheng and Lee, Yung-Huei and Hung, Wei-Shuo}, biburl = {https://www.bibsonomy.org/bibtex/2365941431f6068b45be1a5978194de8c/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2021}, ee = {https://doi.org/10.1109/IRPS46558.2021.9405144}, interhash = {dfc71b9348b1f53e57816ca96279b588}, intrahash = {365941431f6068b45be1a5978194de8c}, isbn = {978-1-7281-6893-7}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:55.000+0200}, title = {Time-Efficient Characterization of Time-Dependent Gate Oxide Breakdwon Using Tunable Ramp Voltage Stress (TRVS) Method for Automotive Applications.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2021.html#HungCCCLH21}, year = 2021 }