%0 Conference Paper %1 conf/icip/JanssensBDVNS15 %A Janssens, Eline %A Beenhouwer, Jan De %A Dael, Mattias Van %A Verboven, Pieter %A Nicolaï, Bart M. %A Sijbers, Jan %B ICIP %D 2015 %I IEEE %K dblp %P 917-921 %T Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system. %U http://dblp.uni-trier.de/db/conf/icip/icip2015.html#JanssensBDVNS15 %@ 978-1-4799-8339-1

@inproceedings{conf/icip/JanssensBDVNS15, added-at = {2021-10-14T00:00:00.000+0200}, author = {Janssens, Eline and Beenhouwer, Jan De and Dael, Mattias Van and Verboven, Pieter and Nicolaï, Bart M. and Sijbers, Jan}, biburl = {https://www.bibsonomy.org/bibtex/2d951e7ad7a645f332a3b0555468964be/dblp}, booktitle = {ICIP}, crossref = {conf/icip/2015}, ee = {https://www.wikidata.org/entity/Q62663813}, interhash = {e57313261200ac8f5358ca8b394e8e98}, intrahash = {d951e7ad7a645f332a3b0555468964be}, isbn = {978-1-4799-8339-1}, keywords = {dblp}, pages = {917-921}, publisher = {IEEE}, timestamp = {2024-04-10T15:42:41.000+0200}, title = {Neural netwok based X-ray tomography for fast inspection of apples on a conveyor belt system.}, url = {http://dblp.uni-trier.de/db/conf/icip/icip2015.html#JanssensBDVNS15}, year = 2015 }