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%0 Conference Paper
%1 conf/itc/MalyFS84
%A Maly, Wojciech
%A Ferguson, F. Joel
%A Shen, John Paul
%B ITC
%D 1984
%I IEEE Computer Society
%K dblp
%P 390-399
%T Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells.
%U http://dblp.uni-trier.de/db/conf/itc/itc1984.html#MalyFS84
@inproceedings{conf/itc/MalyFS84,
added-at = {2002-11-22T00:00:00.000+0100},
author = {Maly, Wojciech and Ferguson, F. Joel and Shen, John Paul},
biburl = {https://www.bibsonomy.org/bibtex/291c0fa44469ec31422c269200938202c/dblp},
booktitle = {ITC},
crossref = {conf/itc/1984},
date = {2002-11-22},
description = {dblp},
interhash = {e7632718de998abd892cc880bfafe7fc},
intrahash = {91c0fa44469ec31422c269200938202c},
keywords = {dblp},
pages = {390-399},
publisher = {IEEE Computer Society},
timestamp = {2002-11-22T00:00:00.000+0100},
title = {Systematic Characterization of Physical Defects for Fault Analysis of MOS IC Cells.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1984.html#MalyFS84},
year = 1984
}