%0 Journal Article %1 journals/mr/RuanNBBCLP07 %A Ruan, Jinyu Jason %A Nolhier, Nicolas %A Bafleur, Marise %A Bary, Laurent %A Coccetti, Fabio %A Lisec, T. %A Plana, Robert %D 2007 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1818-1822 %T Electrostatic discharge failure analysis of capacitive RF MEMS switches. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#RuanNBBCLP07 %V 47

@article{journals/mr/RuanNBBCLP07, added-at = {2020-02-22T00:00:00.000+0100}, author = {Ruan, Jinyu Jason and Nolhier, Nicolas and Bafleur, Marise and Bary, Laurent and Coccetti, Fabio and Lisec, T. and Plana, Robert}, biburl = {https://www.bibsonomy.org/bibtex/2abd2db7215fdc45d80c1528a3830677b/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.070}, interhash = {eeb7facd50fbe23c3ee0efac6f392c2c}, intrahash = {abd2db7215fdc45d80c1528a3830677b}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1818-1822}, timestamp = {2020-02-25T13:22:05.000+0100}, title = {Electrostatic discharge failure analysis of capacitive RF MEMS switches.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#RuanNBBCLP07}, volume = 47, year = 2007 }