%0 Journal Article %1 journals/ieicet/MatsudaTMIOYKT05 %A Matsuda, Toshihiro %A Takeuchi, Hiroaki %A Muramatsu, Akira %A Iwata, Hideyuki %A Ohzone, Takashi %A Yamashita, Kyoji %A Koike, Norio %A ichiro Tatsuuma, Ken %D 2005 %J IEICE Trans. Electron. %K dblp %N 5 %P 811-816 %T A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet88c.html#MatsudaTMIOYKT05 %V 88-C

@article{journals/ieicet/MatsudaTMIOYKT05, added-at = {2020-04-11T00:00:00.000+0200}, author = {Matsuda, Toshihiro and Takeuchi, Hiroaki and Muramatsu, Akira and Iwata, Hideyuki and Ohzone, Takashi and Yamashita, Kyoji and Koike, Norio and ichiro Tatsuuma, Ken}, biburl = {https://www.bibsonomy.org/bibtex/29c671f11fe17fbd12a9e419cdadc2654/dblp}, ee = {https://doi.org/10.1093/ietele/e88-c.5.811}, interhash = {ef66686f8ffe03504067ea122caff0fa}, intrahash = {9c671f11fe17fbd12a9e419cdadc2654}, journal = {IEICE Trans. Electron.}, keywords = {dblp}, number = 5, pages = {811-816}, timestamp = {2020-04-14T11:56:17.000+0200}, title = {A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet88c.html#MatsudaTMIOYKT05}, volume = {88-C}, year = 2005 }