%0 Conference Paper %1 conf/itc/MadgeBWD05 %A Madge, Robert %A Benware, Brady %A Ward, Mark %A Daasch, W. Robert %B ITC %D 2005 %I IEEE Computer Society %K dblp %P 10 %T The value of statistical testing for quality, yield and test cost improvement. %U http://dblp.uni-trier.de/db/conf/itc/itc2005.html#MadgeBWD05 %@ 0-7803-9038-5

@inproceedings{conf/itc/MadgeBWD05, added-at = {2023-03-23T00:00:00.000+0100}, author = {Madge, Robert and Benware, Brady and Ward, Mark and Daasch, W. Robert}, biburl = {https://www.bibsonomy.org/bibtex/2512dd840d1a051210cdd73265b6dd7ee/dblp}, booktitle = {ITC}, crossref = {conf/itc/2005}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2005.1583990}, interhash = {f3212082fd8c7e783b7eafbfca47d8c2}, intrahash = {512dd840d1a051210cdd73265b6dd7ee}, isbn = {0-7803-9038-5}, keywords = {dblp}, pages = 10, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:57.000+0200}, title = {The value of statistical testing for quality, yield and test cost improvement.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2005.html#MadgeBWD05}, year = 2005 }