%0 Journal Article %1 journals/mr/PetitdidierBGTM15 %A Petitdidier, Sébastien %A Berthet, Fanny %A Guhel, Yannick %A Trolet, Jean-Lionel %A Mary, Philippe %A Gaquière, Christophe %A Boudart, Bertrand %D 2015 %J Microelectron. Reliab. %K dblp %N 9-10 %P 1719-1723 %T Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#PetitdidierBGTM15 %V 55

@article{journals/mr/PetitdidierBGTM15, added-at = {2021-07-06T00:00:00.000+0200}, author = {Petitdidier, Sébastien and Berthet, Fanny and Guhel, Yannick and Trolet, Jean-Lionel and Mary, Philippe and Gaquière, Christophe and Boudart, Bertrand}, biburl = {https://www.bibsonomy.org/bibtex/2540cde5f18c3eb251822dc04e7a59db1/dblp}, ee = {https://doi.org/10.1016/j.microrel.2015.06.070}, interhash = {f4584e20dfab4399a40ce3ac3b83257c}, intrahash = {540cde5f18c3eb251822dc04e7a59db1}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-10}, pages = {1719-1723}, timestamp = {2024-04-09T02:49:06.000+0200}, title = {Characterization and analysis of electrical trap related effects on the reliability of AlInN/GaN HEMTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#PetitdidierBGTM15}, volume = 55, year = 2015 }