%0 Conference Paper %1 conf/drc/HuangWJNSLLG0C19 %A Huang, Jian %A Wan, Yating %A Jung, Daehwan %A Norman, Justin %A Shang, Chen %A Li, Qiang %A Lau, Kei May %A Gossard, Arthur C. %A Bowers, John E. %A Chen, Baile %B DRC %D 2019 %I IEEE %K dblp %P 165-166 %T Defect characterization of InAs/InGaAs quantum dot photodetector grown on GaAs-on-V-grooved-Si substrate. %U http://dblp.uni-trier.de/db/conf/drc/drc2019.html#HuangWJNSLLG0C19 %@ 978-1-7281-2112-3

@inproceedings{conf/drc/HuangWJNSLLG0C19, added-at = {2020-04-03T00:00:00.000+0200}, author = {Huang, Jian and Wan, Yating and Jung, Daehwan and Norman, Justin and Shang, Chen and Li, Qiang and Lau, Kei May and Gossard, Arthur C. and Bowers, John E. and Chen, Baile}, biburl = {https://www.bibsonomy.org/bibtex/20f1982268eed2c104b76688035448bde/dblp}, booktitle = {DRC}, crossref = {conf/drc/2019}, ee = {https://doi.org/10.1109/DRC46940.2019.9046450}, interhash = {f9c0ef415461d2b853caed13f655d2f3}, intrahash = {0f1982268eed2c104b76688035448bde}, isbn = {978-1-7281-2112-3}, keywords = {dblp}, pages = {165-166}, publisher = {IEEE}, timestamp = {2020-04-04T11:47:30.000+0200}, title = {Defect characterization of InAs/InGaAs quantum dot photodetector grown on GaAs-on-V-grooved-Si substrate.}, url = {http://dblp.uni-trier.de/db/conf/drc/drc2019.html#HuangWJNSLLG0C19}, year = 2019 }