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Test point insertion in hybrid test compression/LBIST architectures., , , , and . ITC, page 1-10. IEEE, (2016)Design for low test pattern counts., , , , , , and . DAC, page 136:1-136:6. ACM, (2015)Isometric Test Data Compression., , , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 34 (11): 1847-1859 (2015)An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits., and . DSD, page 619-625. IEEE Computer Society, (2007)Isometric test compression with low toggling activity., , , , , , , and . ITC, page 1-7. IEEE Computer Society, (2014)Test Time and Area Optimized BrST Scheme for Automotive ICs., , , , , , , , , and . ITC, page 1-10. IEEE, (2019)At-speed scan test with low switching activity., , , and . VTS, page 177-182. IEEE Computer Society, (2010)Minimal area test points for deterministic patterns., , , , , and . ITC, page 1-7. IEEE, (2016)An On-Line BIST Technique for Delay Fault Detection in CMOS Circuits., and . ATS, page 73-78. IEEE, (2007)On New Test Points for Compact Cell-Aware Tests., , , , , , , , , and . IEEE Des. Test, 33 (6): 7-14 (2016)