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New Scan-Based Attack Using Only the Test Mode and an Input Corruption Countermeasure., , , and . VLSI-SoC (Selected Papers), volume 461 of IFIP Advances in Information and Communication Technology, page 48-68. Springer, (2013)New scan-based attack using only the test mode., , , and . VLSI-SoC, page 234-239. IEEE, (2013)Can ML-Based Reliability Models Span Quantum Hardware Boundaries?, , , and . ISVLSI, page 607-612. IEEE, (2024)Quantum Circuit Partitioning for Scalable Noise-Aware Quantum Circuit Re-Synthesis., , , , and . QCE, page 359-364. IEEE, (2024)Graph Neural Networks for Idling Error Mitigation., and . ICCAD, page 139:1-139:9. ACM, (2022)A Lightweight Approach to Detect Malicious/Unexpected Changes in the Error Rates of NISQ Computers., and . ICCAD, page 153:1-153:9. IEEE, (2020)DfST: Design for secure testability.. ITC, page 1-10. IEEE Computer Society, (2014)An Attack on Quantum Circuits Based on the Error Rates of NISQ Systems and a Countermeasure., , and . SVCC, volume 1383 of Communications in Computer and Information Science, page 109-114. Springer, (2020)Test Data-Driven Machine Learning Models for Reliable Quantum Circuit Output., and . ETS, page 1-6. IEEE, (2021)On the Difficulty of Inserting Trojans in Reversible Computing Architectures., , , , , , and . IEEE Trans. Emerg. Top. Comput., 8 (4): 960-972 (2020)