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Test implications and challenges in near threshold computing special session.

, , , и . VTS, стр. 1. IEEE Computer Society, (2016)

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Resiliency in dynamically power managed designs., , и . ICCAD, стр. 69. ACM, (2016)The road to a trillion: Making the IoT work.. VLSI-DAT, стр. 1. IEEE, (2017)Addressing design margins through error-tolerant circuits., , , , и . DAC, стр. 11-12. ACM, (2009)Time to retire our benchmarks.. IEEE Des. Test Comput., 27 (3): 88 (2010)Yield Learning Perspectives.. IEEE Des. Test Comput., 29 (1): 59-62 (2012)Welcome message., и . ITC, стр. 1. IEEE Computer Society, (2013)Special Session 4: Reliability and Circuit Simulation.. IOLTS, стр. 195-196. IEEE Computer Society, (2008)Test as a Key Enabler for Faster Yield Ramp-Up., , , , , , , и . VTS, стр. 177-180. IEEE Computer Society, (2002)Test implications and challenges in near threshold computing special session., , , и . VTS, стр. 1. IEEE Computer Society, (2016)Mobile hardware security., и . Hot Chips Symposium, стр. 1-40. IEEE, (2014)