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CROWNE: Current Ratio Outliers with Neighbor Estimator.

, и . DFT, стр. 132-139. IEEE Computer Society, (2003)

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Другие публикации лиц с тем же именем

Improved wafer-level spatial analysis for I_DDQ limit setting., и . ITC, стр. 82-91. IEEE Computer Society, (2001)CROWNE: Current Ratio Outliers with Neighbor Estimator., и . DFT, стр. 132-139. IEEE Computer Society, (2003)Use of Multiple IDDQ Test Metrics for Outlier Identification., и . VTS, стр. 31-38. IEEE Computer Society, (2003)Evaluation of Effectiveness of Median of Absolute Deviations Outlier Rejection-based IDDQ Testing for Burn-in Reduction., и . VTS, стр. 81-86. IEEE Computer Society, (2002)Estimation of fault-free leakage current using wafer-level spatial information., и . IEEE Trans. Very Large Scale Integr. Syst., 14 (1): 91-94 (2006)Evaluation of Statistical Outlier Rejection Methods for IDDQ Limit Setting., и . ASP-DAC/VLSI Design, стр. 755-760. IEEE Computer Society, (2002)On Comparison of NCR Effectiveness with a Reduced IDDQ Vector Set., и . VTS, стр. 65-72. IEEE Computer Society, (2004)Neighbor Current Ratio (NCR): A New Metric for IDDQ Data Analysis., и . DFT, стр. 381-389. IEEE Computer Society, (2002)Comparison of Effectiveness of Current Ratio and Delta-IDDQ Tests., и . VLSI Design, стр. 889-894. IEEE Computer Society, (2004)Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification., и . VLSI Design, стр. 361-. IEEE Computer Society, (2003)