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Transition Delay Fault Test Pattern Generation Considering Supply Voltage Noise in a SOC Design.

, , and . DAC, page 533-538. IEEE, (2007)

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Pattern grading for testing critical paths considering power supply noise and crosstalk using a layout-aware quality metric., , , , and . ACM Great Lakes Symposium on VLSI, page 127-130. ACM, (2010)Local At-Speed Scan Enable Generation for Transition Fault Testing Using Low-Cost Testers., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 26 (5): 896-906 (2007)A Novel Faster-Than-at-Speed Transition-Delay Test Method Considering IR-Drop Effects., and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (10): 1573-1582 (2009)Robust Control of Grid-Tied Parallel Inverters Using Nonlinear Backstepping Approach., , , , , , and . IEEE Access, (2019)Demonstration of OAM-based MIMO FSO link using spatial diversity and MIMO equalization for turbulence mitigation., , , , , , , , , and 4 other author(s). OFC, page 1-3. IEEE, (2016)Performance enhancement of an orbital-angular-momentum-based free-space optical communication link through beam divergence controlling., , , , , , , , , and 5 other author(s). OFC, page 1-3. IEEE, (2015)Dividing and multiplying the mode order for orbital-angular-momentum beams., , , , , , , , , and 1 other author(s). ECOC, page 1-3. IEEE, (2015)Is test power reduction through X-filling good enough?, , , , , , , , , and . ITC, page 805. IEEE Computer Society, (2010)A dual-channel 60 GHz communications link using patch antenna arrays to generate data-carrying orbital-angular-momentum beams., , , , , , , , , and 11 other author(s). ICC, page 1-6. IEEE, (2016)Low power pattern generation for BIST architecture., , and . ISCAS (2), page 689-692. IEEE, (2004)