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Nested Quantization Index Modulation for Reversible Watermarking and Its Application to Healthcare Information Management Systems., , , , и . Comput. Math. Methods Medicine, (2012)Automatic Inspection for Wafer Defect Pattern Recognition with Unsupervised Clustering., , , , , , , , , и 2 other автор(ы). ETS, стр. 1-2. IEEE, (2021)Yield-award placement optimization for Switched-Capacitor analog integrated circuits., , , и . SoCC, стр. 170-173. IEEE, (2011)Fault Analysis on Two-Level (K+1)-Valued Logic Circuits., , и . ISMVL, стр. 181-188. IEEE Computer Society, (1992)Fanout fault analysis for digital logic circuits., , , и . Asian Test Symposium, стр. 33-39. IEEE Computer Society, (1995)Is IDDQ testing not applicable for deep submicron VLSI in year 2011?, , , и . Asian Test Symposium, стр. 338-343. IEEE Computer Society, (2000)Adaptive Encoding Scheme for Test Volume/Time Reduction in SoC Scan Testing., , и . Asian Test Symposium, стр. 324-329. IEEE Computer Society, (2005)A Two-Phase Fault Simulation Scheme for Sequential Circuits., , и . J. Inf. Sci. Eng., 14 (3): 669-686 (1998)Educational Robot - A Case Study for Robot Learning Companion., , , , , и . ICCE, том 133 из Frontiers in Artificial Intelligence and Applications, стр. 686-689. IOS Press, (2005)Optimal common-centroid-based unit capacitor placements for yield enhancement of switched-capacitor circuits., , , и . ACM Trans. Design Autom. Electr. Syst., 19 (1): 7:1-7:13 (2013)