( en | de | ru )

 

Disambiguation

From post

копироватьудалитьдобавить публикацию в буфер
On the Switching Activity in Faulty Circuits During Test Application.

, и . ATS, стр. 13-18. IEEE Computer Society, (2016)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed.

Irith Baumann

Irith Wiegand

Irith Bittmann

Alexander Pomeranz

Irith Reuters

 

Другие публикации лиц с тем же именем

On multiple bridging faults., и . VTS, стр. 221-226. IEEE Computer Society, (2010)On Improving Fault Diagnosis for Synchronous Sequential Circuits., и . DAC, стр. 504-509. ACM Press, (1994)INCREDYBLE-TG: INCREmental DYnamic test generation based on LEarning., и . DAC, стр. 80-85. ACM Press, (1993)Functional Broadside Tests with Minimum and Maximum Switching Activity., и . J. Low Power Electron., 4 (3): 429-437 (2008)Semiconcurrent Online Testing of Transition Faults through Output Response Comparison of Identical Circuits., и . IEEE Trans. Dependable Secur. Comput., 6 (3): 231-240 (2009)Autonomous Multicycle Tests With Low Storage and Test Application Time Overheads.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 37 (9): 1881-1892 (2018)On synchronizable circuits and their synchronizing sequences., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 19 (9): 1086-1092 (2000)Functional Broadside Tests for Multistep Defect Diagnosis.. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 33 (9): 1429-1433 (2014)Theorems for identifying undetectable faults in partial-scan circuits., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 22 (8): 1092-1097 (2003)Testing of scan circuits containing nonisolated random-logic legacycores., и . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 20 (8): 980-993 (2001)