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A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering.

S. Lu, C. Lee, P. Noel, S. Adham, T. Wong, and J. Chang. VLSI-DAT, page 1-4. IEEE, (2019)

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Fu-Chang Chang

Sheng-Chia Chang

William Ockham's view on human capabilityS. Chang. Uni Frankfurt Main, (2009)

Jonathan Roericht

Jonathan Burmeister

Jonathan Rother

Other publications of authors with the same name

A 64-Kb 0.37V 28nm 10T-SRAM with mixed-Vth read-port and boosted WL scheme for IoT applications.H. Fujiwara, Y. Chen, C. Lin, W. Wu, D. Sun, S. Wu, H. Liao, and J. Chang. A-SSCC, page 185-188. IEEE, (2016)RIFLE: An Architectural Framework for User-Centric Information-Flow Security.N. Vachharajani, M. Bridges, J. Chang, R. Rangan, G. Ottoni, J. Blome, G. Reis, M. Vachharajani, and D. August. MICRO, page 243-254. IEEE Computer Society, (2004)Reliability Analysis of Physically Unclonable Function by Using Aging Variability Simulation.J. Ahn, J. Wesselkamper, R. Baek, P. Yeh, J. Chang, J. Wong, and X. Wu. IRPS, page 1. IEEE, (2022)Power reduction techniques for an 8-core xeon® processor.S. Rusu, S. Tam, H. Muljono, J. Stinson, D. Ayers, J. Chang, R. Varada, M. Ratta, S. Kottapalli, and S. Vora. ESSCIRC, page 340-343. IEEE, (2009)High Density Embedded 3D Stackable Via RRAM in Advanced MCU Applications.Y. Huang, Y. Hsieh, Y. Lin, Y. Chih, E. Wang, J. Chang, Y. King, and C. Lin. VLSI Technology and Circuits, page 1-2. IEEE, (2023)13.5 A 16nm 128Mb SRAM in high-κ metal-gate FinFET technology with write-assist circuitry for low-VMIN applications.Y. Chen, W. Chan, W. Wu, H. Liao, K. Pan, J. Liaw, T. Chung, Q. Li, G. Chang, C. Lin and 4 other author(s). ISSCC, page 238-239. IEEE, (2014)Design and Evaluation of Hybrid Fault-Detection Systems.G. Reis, J. Chang, N. Vachharajani, R. Rangan, D. August, and S. Mukherjee. ISCA, page 148-159. IEEE Computer Society, (2005)ePluribus: Ethnicity on Social Networks.J. Chang, I. Rosenn, L. Backstrom, and C. Marlow. ICWSM, The AAAI Press, (2010)A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering.S. Lu, C. Lee, P. Noel, S. Adham, T. Wong, and J. Chang. VLSI-DAT, page 1-4. IEEE, (2019)15.3 A 351TOPS/W and 372.4GOPS Compute-in-Memory SRAM Macro in 7nm FinFET CMOS for Machine-Learning Applications.Q. Dong, M. Sinangil, B. Erbagci, D. Sun, W. Khwa, H. Liao, Y. Wang, and J. Chang. ISSCC, page 242-244. IEEE, (2020)

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Disambiguation of "Chang, Jonathan"

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A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering.

Please choose a person to relate this publication to

Fu-Chang Chang

Sheng-Chia Chang

Jonathan Roericht

Jonathan Burmeister

Jonathan Rother

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chang, Jonathan"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering.

Please choose a person to relate this publication to

Fu-Chang Chang

Sheng-Chia Chang

Jonathan Roericht

Jonathan Burmeister

Jonathan Rother

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

A Reliable, Low-Cost, Low-Energy Physically Unclonable Function Circuit Through Effective Filtering.