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Partial Scan Selection Based on Dynamic Reachability and Observability Information.

, , , и . VLSI Design, стр. 174-180. IEEE Computer Society, (1998)

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Ute Saunders

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Другие публикации лиц с тем же именем

A STAFAN-like functional testability measure for register-level circuits., , и . Asian Test Symposium, стр. 192-198. IEEE Computer Society, (1995)Partial Scan beyond Cycle Cutting., , и . FTCS, стр. 320-328. IEEE Computer Society, (1997)A functional-level testability measure for register-level circuits and its estimation., , и . Microprocess. Microsystems, 22 (9): 535-542 (1999)Partial Scan Selection Based on Dynamic Reachability and Observability Information., , , и . VLSI Design, стр. 174-180. IEEE Computer Society, (1998)