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Wafer probe test cost reduction of an RF/A device by automatic testset minimization - A case study., and . ITC, page 1-10. IEEE Computer Society, (2011)Mining AC delay measurements for understanding speed-limiting paths., , , , , and . ITC, page 553-562. IEEE Computer Society, (2010)Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits., , , , and . DATE, page 794-799. IEEE, (2011)Minimizing outlier delay test cost in the presence of systematic variability., , , and . ITC, page 1-10. IEEE Computer Society, (2009)Forward prediction based on wafer sort data - A case study., , , , and . ITC, page 1-10. IEEE Computer Society, (2011)Predicting variability in nanoscale lithography processes., , and . DAC, page 545-550. ACM, (2009)A non-parametric approach to behavioral device modeling., , and . ISQED, page 284-290. IEEE, (2010)Innovative practices session 5C: Machine learning and data analysis in test., , , and . VTS, page 1. IEEE Computer Society, (2014)A Study of Outlier Analysis Techniques for Delay Testing., , and . ITC, page 1-10. IEEE Computer Society, (2008)Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch., , , and . DAC, page 374-379. ACM, (2010)