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Spatial locality exploitation for runtime reordering of JPEG2000 wavelet data layouts.

B. Geelen, V. Ferentinos, F. Catthoor, G. Lafruit, D. Verkest, R. Lauwereins, and T. Stouraitis. ACM Trans. Design Autom. Electr. Syst., 15 (1): 8:1-8:6 (2009)

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Mapping Spiking Neural Networks to Neuromorphic Hardware.A. Balaji, A. Das, Y. Wu, K. Huynh, F. Dell'Anna, G. Indiveri, J. Krichmar, N. Dutt, S. Schaafsma, and F. Catthoor. CoRR, (2019)A tool flow for predicting system level timing failures due to interconnect reliability degradation.J. Guo, A. Papanikolaou, M. Stucchi, K. Croes, Z. Tokei, and F. Catthoor. ACM Great Lakes Symposium on VLSI, page 291-296. ACM, (2008)Functional Equivalence Checking for Verification of Algebraic Transformations on Array-Intensive Source CodeK. Shashidhar, M. Bruynooghe, F. Catthoor, and G. Janssens. CoRR, (2007)Spatial locality exploitation for runtime reordering of JPEG2000 wavelet data layouts.B. Geelen, V. Ferentinos, F. Catthoor, G. Lafruit, D. Verkest, R. Lauwereins, and T. Stouraitis. ACM Trans. Design Autom. Electr. Syst., 15 (1): 8:1-8:6 (2009)Control flow optimization for fast system simulation and storage minimization.F. Franssen, L. Nachtergaele, H. Samsom, F. Catthoor, and H. Man. EDAC-ETC-EUROASIC, page 20-24. IEEE Computer Society, (1994)Systematic architecture exploration based on optimistic cycle estimation for low energy embedded processors.I. Taniguchi, M. Jayapala, P. Raghavan, F. Catthoor, K. Sakanushi, Y. Takeuchi, and M. Imai. ASP-DAC, page 449-454. IEEE, (2009)Towards high-performance polarity-controllable FETs with 2D materials.G. Resta, J. Gonzalez, Y. Balaji, T. Agarwal, D. Lin, F. Catthoor, I. Radu, G. Micheli, and P. Gaillardon. DATE, page 637-641. IEEE, (2018)Degradation analysis of high performance 14nm FinFET SRAM.D. Kraak, I. Agbo, M. Taouil, S. Hamdioui, P. Weckx, S. Cosemans, and F. Catthoor. DATE, page 201-206. IEEE, (2018)Finite precision processing in wireless applications.D. Novo, M. Li, B. Bougard, L. der Perre, and F. Catthoor. DATE, page 1230-1233. IEEE, (2009)Analysis of scratch-pad and data-cache performance using statistical methods.J. Absar, and F. Catthoor. ASP-DAC, page 820-825. IEEE, (2006)

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Spatial locality exploitation for runtime reordering of JPEG2000 wavelet data layouts.

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copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Spatial locality exploitation for runtime reordering of JPEG2000 wavelet data layouts.

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Spatial locality exploitation for runtime reordering of JPEG2000 wavelet data layouts.