Author of the publication

An Advanced Hybrid Boot-LSTM-ICSO-PP Approach for Day-Ahead Probabilistic PV Power Yield Forecasting and Intra-Hour Power Fluctuation Estimation.

, , , , and . IEEE Access, (2024)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Catthoor, Francky
add a person with the name Catthoor, Francky
 

Other publications of authors with the same name

Run-time Task Overlapping on Multiprocessor Platforms., and . J. Signal Process. Syst., 60 (2): 169-182 (2010)Formalized three-layer system-level model and reuse methodology for embedded data-dominated applications., , , and . IEEE Trans. Very Large Scale Integr. Syst., 8 (2): 207-216 (2000)Parametric and Functional Degradation Analysis of Complete 14-nm FinFET SRAM., , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 27 (6): 1308-1321 (2019)Background memory area estimation for multidimensional signal processing systems., , and . IEEE Trans. Very Large Scale Integr. Syst., 3 (2): 157-172 (1995)Design and Synthesis of Pareto Buffers Offering Large Range Runtime Energy/Delay Tradeoffs Via Combined Buffer Size and Supply Voltage Tuning., , , and . IEEE Trans. Very Large Scale Integr. Syst., 17 (1): 117-127 (2009)Transformation of Nested Loops with Modulo Indexing to Affine Recurrences., , , and . Parallel Process. Lett., (1994)Data dependency size estimation for use in memory optimization., , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 22 (7): 908-921 (2003)Experience with Widening Based Equivalence Checking in Realistic Multimedia Systems., , , , and . J. Electron. Test., 26 (2): 279-292 (2010)Energy-aware compilation and hardware design for VLIW embedded systems., , , , , and . Int. J. Embed. Syst., 3 (1/2): 73-82 (2007)Partial scan and symbolic test at the register-transfer level., , and . J. Electron. Test., 7 (1-2): 7-23 (1995)