%0 Journal Article %1 journals/scjapan/HigamiKIT05 %A Higami, Yoshinobu %A Kajihara, Seiji %A Ichihara, Hideyuki %A Takamatsu, Yuzo %D 2005 %J Syst. Comput. Jpn. %K dblp %N 6 %P 69-83 %T Test cost reduction for logic circuits: Reduction of test data volume and test application time. %U http://dblp.uni-trier.de/db/journals/scjapan/scjapan36.html#HigamiKIT05 %V 36

@article{journals/scjapan/HigamiKIT05, added-at = {2023-09-13T00:00:00.000+0200}, author = {Higami, Yoshinobu and Kajihara, Seiji and Ichihara, Hideyuki and Takamatsu, Yuzo}, biburl = {https://www.bibsonomy.org/bibtex/2b63b92fda951202062d11601eb02862a/dblp}, ee = {https://doi.org/10.1002/scj.20240}, interhash = {11553ba4b33fca067769d6475e2744e1}, intrahash = {b63b92fda951202062d11601eb02862a}, journal = {Syst. Comput. Jpn.}, keywords = {dblp}, number = 6, pages = {69-83}, timestamp = {2024-04-09T07:26:47.000+0200}, title = {Test cost reduction for logic circuits: Reduction of test data volume and test application time.}, url = {http://dblp.uni-trier.de/db/journals/scjapan/scjapan36.html#HigamiKIT05}, volume = 36, year = 2005 }