%0 Journal Article %1 journals/mr/ZhangCHLF18 %A Zhang, Jizuo %A Chen, Jianjun %A Huang, Pengcheng %A Li, Shouping %A Fang, Liang %D 2018 %J Microelectron. Reliab. %K dblp %P 278-282 %T Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology. %U http://dblp.uni-trier.de/db/journals/mr/mr91.html#ZhangCHLF18 %V 91

@article{journals/mr/ZhangCHLF18, added-at = {2020-02-22T00:00:00.000+0100}, author = {Zhang, Jizuo and Chen, Jianjun and Huang, Pengcheng and Li, Shouping and Fang, Liang}, biburl = {https://www.bibsonomy.org/bibtex/2eab79bbd9ba5fb4c45ab9b50cfa77a4e/dblp}, ee = {https://doi.org/10.1016/j.microrel.2018.10.015}, interhash = {14964063fea1781972d2ff81c1b1faab}, intrahash = {eab79bbd9ba5fb4c45ab9b50cfa77a4e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {278-282}, timestamp = {2020-02-25T13:25:51.000+0100}, title = {Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr91.html#ZhangCHLF18}, volume = 91, year = 2018 }