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Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.

J. Zhang, J. Chen, P. Huang, S. Li, and L. Fang. Microelectron. Reliab., (2018)

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Jianjun Yang

Jianjun Tao

Jianjun Wang

Jianjun Feng

Jianjun Pu

Other publications of authors with the same name

A state recovery design against single-event transient in high-speed phase interpolation clock and data recovery circuit.J. wei Tan, Y. Guo, J. Chen, H. Yuan, and X. Chen. ASICON, page 339-342. IEEE, (2017)Single Event Transient Study of pMOS Transistors in 65 nm Technology With and Without a Deep n+ Well Under Particle Striking.J. Zhang, L. Fang, J. Chen, S. Hou, and X. Tong. IEEE Access, (2019)Stacked Fully Convolutional Networks for Pulmonary Vessel Segmentation.Y. Wang, J. Chen, C. Liu, and Z. Mao. VCIP, page 1-4. IEEE, (2018)Booleans of triangulated solids by a boundary conforming tetrahedral mesh generation approach.Z. Xiao, J. Chen, Y. Zheng, J. Zheng, and D. Wang. Comput. Graph., (2016)Workload Management in Database Management Systems: A Taxonomy.M. Zhang, P. Martin, W. Powley, and J. Chen. IEEE Trans. Knowl. Data Eng., 30 (7): 1386-1402 (2018)Automatic surface repairing, defeaturing and meshing algorithms based on an extended B-rep.J. Chen, B. wan Cao, Y. Zheng, L. Xie, C. Li, and Z. Xiao. Adv. Eng. Softw., (2015)Research on the effect of single-event transient of an on-chip linear voltage regulator fabricated on 130 nm commercial CMOS technology.Q. Zhao, G. Yang, Y. Sun, P. Yu, J. Chen, and B. Liang. Microelectron. Reliab., (2017)The Yahoo!: cloud datastore load balancer.M. Klems, A. Silberstein, J. Chen, M. Mortazavi, S. Albert, P. Narayan, A. Tumbde, and B. Cooper. CloudDB@CIKM, page 33-40. ACM, (2012)Cost-effective SET-tolerant clock distribution network design by mitigating single event transient propagation.P. Hao, S. Chen, P. Huang, J. Chen, and B. Liang. Sci. China Inf. Sci., 60 (10): 108401:1-108401:3 (2017)Dependency of well-contact density on MCUs in 65-nm bulk CMOS SRAM.C. Xie, Y. Chen, J. Chen, and J. Zhang. Sci. China Inf. Sci., 62 (6): 69402:1-69402:3 (2019)

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Disambiguation of "Chen, Jianjun"

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Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.

Please choose a person to relate this publication to

Jianjun Yang

Jianjun Tao

Jianjun Wang

Jianjun Feng

Jianjun Pu

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chen, Jianjun"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.

Please choose a person to relate this publication to

Jianjun Yang

Jianjun Tao

Jianjun Wang

Jianjun Feng

Jianjun Pu

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Angular dependency on heavy-ion-induced single-event multiple transients (SEMT) in 65 nm twin-well and triple-well CMOS technology.