%0 Journal Article %1 journals/tcad/NiermannRPA92 %A Niermann, Thomas M. %A Roy, Rabindra K. %A Patel, Janak H. %A Abraham, Jacob A. %D 1992 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 2 %P 260-267 %T Test compaction for sequential circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad11.html#NiermannRPA92 %V 11

@article{journals/tcad/NiermannRPA92, added-at = {2020-09-24T00:00:00.000+0200}, author = {Niermann, Thomas M. and Roy, Rabindra K. and Patel, Janak H. and Abraham, Jacob A.}, biburl = {https://www.bibsonomy.org/bibtex/220bf4316e271b762db6273b2b332df85/dblp}, ee = {https://doi.org/10.1109/43.124404}, interhash = {173e49a3ac49f5b027e73eeeb92b716f}, intrahash = {20bf4316e271b762db6273b2b332df85}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 2, pages = {260-267}, timestamp = {2020-09-25T11:47:08.000+0200}, title = {Test compaction for sequential circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad11.html#NiermannRPA92}, volume = 11, year = 1992 }