%0 Journal Article %1 journals/jolpe/ButzenBRR10 %A Butzen, Paulo F. %A Bem, Vinícius Dal %A Reis, André Inácio %A Ribas, Renato P. %D 2010 %J J. Low Power Electron. %K dblp %N 1 %P 192-200 %T Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits. %U http://dblp.uni-trier.de/db/journals/jolpe/jolpe6.html#ButzenBRR10 %V 6

@article{journals/jolpe/ButzenBRR10, added-at = {2021-10-14T00:00:00.000+0200}, author = {Butzen, Paulo F. and Bem, Vinícius Dal and Reis, André Inácio and Ribas, Renato P.}, biburl = {https://www.bibsonomy.org/bibtex/2c3bb4d095ea08768bfcecaa366c185b3/dblp}, ee = {https://doi.org/10.1166/jolpe.2010.1070}, interhash = {50f540baa54a53cdd56f3157df5b18d2}, intrahash = {c3bb4d095ea08768bfcecaa366c185b3}, journal = {J. Low Power Electron.}, keywords = {dblp}, number = 1, pages = {192-200}, timestamp = {2024-04-09T01:46:29.000+0200}, title = {Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits.}, url = {http://dblp.uni-trier.de/db/journals/jolpe/jolpe6.html#ButzenBRR10}, volume = 6, year = 2010 }