( en | de | ru )

 

Disambiguation of "Bem, Vinícius Dal"

Author of the publication

copydeleteadd this publication to your clipboard
Leakage Analysis Considering the Effect of Inter-Cell Wire Resistance for Nanoscaled CMOS Circuits.

, , , and . J. Low Power Electron., 6 (1): 192-200 (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Vinícius Liebel

Vinícius Maran

Vinicius Malatesta

Attila Dal

Ingerid Dal

 

Other publications of authors with the same name

Transistor sizing in lithography-aware regular fabrics., , , , and . SBCCI, page 97-102. ACM, (2011)Lithography analysis of via-configurable transistor-array fabrics., , and . NORCHIP, page 1-4. IEEE, (2012)Analytical logical effort formulation for minimum active area under delay constraints., , , and . SBCCI, page 1-6. IEEE, (2013)Transistor Sizing Analysis of Regular Fabrics., , , , and . ARCS Workshops, VDE-Verlag, (2011)Transistor network restructuring against NBTI degradation., , , and . Microelectron. Reliab., 50 (9-11): 1298-1303 (2010)Design of CMOS logic gates with enhanced robustness against aging degradation., , , and . Microelectron. Reliab., 52 (9-10): 1822-1826 (2012)SAT-Based Formulation for Logical Capacity Evaluation of VIA-Configurable Structured ASIC., , , and . IEEE Trans. Emerg. Top. Comput., 5 (2): 247-259 (2017)SAT based environment for logical capacity evaluation of via configurable block templates.. Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil, (2016)ndltd.org (oai:agregador.ibict.br.BDTD_UFRGS:oai:www.lume.ufrgs.br:10183/142737).BTI and HCI first-order aging estimation for early use in standard cell technology mapping., , , and . Microelectron. Reliab., 53 (9-11): 1360-1364 (2013)Impact and optimization of lithography-aware regular layout in digital circuit design., , , , and . ICCD, page 279-284. IEEE Computer Society, (2011)