%0 Conference Paper %1 conf/vlsi/IwagakiOF06a %A Iwagaki, Tsuyoshi %A Ohtake, Satoshi %A Fujiwara, Hideo %B VLSI-SoC (Selected Papers) %D 2006 %E Micheli, Giovanni De %E Mir, Salvador %E Reis, Ricardo %I Springer %K dblp %P 301-316 %T Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation. %U http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2006s.html#IwagakiOF06a %V 249 %@ 978-0-387-74908-2

@inproceedings{conf/vlsi/IwagakiOF06a, added-at = {2018-06-26T00:00:00.000+0200}, author = {Iwagaki, Tsuyoshi and Ohtake, Satoshi and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/2733e89673b6406839e00b81e6e635751/dblp}, booktitle = {VLSI-SoC (Selected Papers)}, crossref = {conf/vlsi/2006socs}, editor = {Micheli, Giovanni De and Mir, Salvador and Reis, Ricardo}, ee = {https://doi.org/10.1007/978-0-387-74909-9_17}, interhash = {5483fdccf54f2f1a4accda85416a1414}, intrahash = {733e89673b6406839e00b81e6e635751}, isbn = {978-0-387-74908-2}, keywords = {dblp}, pages = {301-316}, publisher = {Springer}, series = {IFIP}, timestamp = {2019-10-23T11:39:59.000+0200}, title = {Broadside Transition Test Generation for Partial Scan Circuits through Stuck-at Test Generation.}, url = {http://dblp.uni-trier.de/db/conf/vlsi/vlsisoc2006s.html#IwagakiOF06a}, volume = 249, year = 2006 }