%0 Conference Paper %1 conf/ats/KambaraYMHL17 %A Kambara, Ayumu %A Yotsuyanagi, Hiroyuki %A Miyoshi, Daichi %A Hashizume, Masaki %A Lu, Shyue-Kung %B ATS %D 2017 %I IEEE Computer Society %K dblp %P 242-247 %T Open Defect Detection with a Built-in Test Circuit by IDDT Appearance Time in CMOS ICs. %U http://dblp.uni-trier.de/db/conf/ats/ats2017.html#KambaraYMHL17 %@ 978-1-5386-2437-1

@inproceedings{conf/ats/KambaraYMHL17, added-at = {2023-03-24T00:00:00.000+0100}, author = {Kambara, Ayumu and Yotsuyanagi, Hiroyuki and Miyoshi, Daichi and Hashizume, Masaki and Lu, Shyue-Kung}, biburl = {https://www.bibsonomy.org/bibtex/245b2516c65095e23cbeebaaca3b4fb14/dblp}, booktitle = {ATS}, crossref = {conf/ats/2017}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2017.53}, interhash = {55e9143b83082ab350d79dd2098d994d}, intrahash = {45b2516c65095e23cbeebaaca3b4fb14}, isbn = {978-1-5386-2437-1}, keywords = {dblp}, pages = {242-247}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:36.000+0200}, title = {Open Defect Detection with a Built-in Test Circuit by IDDT Appearance Time in CMOS ICs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2017.html#KambaraYMHL17}, year = 2017 }