%0 Journal Article %1 journals/mr/LauYCHLSC09 %A Lau, W. S. %A Yang, Peizhen %A Chian, Jason Zhiwei %A Ho, V. %A Loh, C. H. %A Siah, S. Y. %A Chan, L. %D 2009 %J Microelectron. Reliab. %K dblp %N 1 %P 1-7 %T Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#LauYCHLSC09 %V 49

@article{journals/mr/LauYCHLSC09, added-at = {2020-02-22T00:00:00.000+0100}, author = {Lau, W. S. and Yang, Peizhen and Chian, Jason Zhiwei and Ho, V. and Loh, C. H. and Siah, S. Y. and Chan, L.}, biburl = {https://www.bibsonomy.org/bibtex/2e8ed43b3b01a12d82300243c237f14a9/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.10.006}, interhash = {650734b96229bb7f4a8de264f693f34b}, intrahash = {e8ed43b3b01a12d82300243c237f14a9}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {1-7}, timestamp = {2020-02-25T13:26:56.000+0100}, title = {Drain current saturation at high drain voltage due to pinch off instead of velocity saturation in sub-100 nm metal-oxide-semiconductor transistors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#LauYCHLSC09}, volume = 49, year = 2009 }