%0 Conference Paper %1 conf/irps/KoPRKLLPLJJJUKD20 %A Ko, Heung-Kook %A Park, Sena %A Ryu, Jihyun %A Kim, Sung Ryul %A Lee, Giwon %A Lee, Dongjoon %A Pae, Sangwoo %A Lee, Euncheol %A Ji, Yongsun %A Jiang, Hai %A Jeong, Taeyoung %A Uemura, Taiki %A Kwon, Dongkyun %A Do, Hyungrok %A Kahng, Hyungu %A Cho, Yoon-Sang %A Lee, Jiyoon %A Kim, Seoung Bum %B IRPS %D 2020 %I IEEE %K dblp %P 1-5 %T Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#KoPRKLLPLJJJUKD20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/KoPRKLLPLJJJUKD20, added-at = {2023-09-30T00:00:00.000+0200}, author = {Ko, Heung-Kook and Park, Sena and Ryu, Jihyun and Kim, Sung Ryul and Lee, Giwon and Lee, Dongjoon and Pae, Sangwoo and Lee, Euncheol and Ji, Yongsun and Jiang, Hai and Jeong, Taeyoung and Uemura, Taiki and Kwon, Dongkyun and Do, Hyungrok and Kahng, Hyungu and Cho, Yoon-Sang and Lee, Jiyoon and Kim, Seoung Bum}, biburl = {https://www.bibsonomy.org/bibtex/2e47737b13e1aecc0b9ecea1605690f72/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9128932}, interhash = {7d2b566bfbb3f58a43dff5af127c650f}, intrahash = {e47737b13e1aecc0b9ecea1605690f72}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-10T16:56:46.000+0200}, title = {Early Diagnosis and Prediction of Wafer Quality Using Machine Learning on sub-10nm Logic Technology.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#KoPRKLLPLJJJUKD20}, year = 2020 }