%0 Journal Article %1 journals/mr/KeaneKWK10 %A Keane, John %A Kim, Tony Tae-Hyoung %A Wang, Xiaofei %A Kim, Chris H. %D 2010 %J Microelectron. Reliab. %K dblp %N 8 %P 1039-1053 %T On-chip reliability monitors for measuring circuit degradation. %U http://dblp.uni-trier.de/db/journals/mr/mr50.html#KeaneKWK10 %V 50

@article{journals/mr/KeaneKWK10, added-at = {2020-02-22T00:00:00.000+0100}, author = {Keane, John and Kim, Tony Tae-Hyoung and Wang, Xiaofei and Kim, Chris H.}, biburl = {https://www.bibsonomy.org/bibtex/286955e434d9cbd343af27ceef4d4a928/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.04.024}, interhash = {8149dd1f45955103417d30e83034e2af}, intrahash = {86955e434d9cbd343af27ceef4d4a928}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 8, pages = {1039-1053}, timestamp = {2020-02-25T13:26:15.000+0100}, title = {On-chip reliability monitors for measuring circuit degradation.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr50.html#KeaneKWK10}, volume = 50, year = 2010 }