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%0 Conference Paper
%1 conf/vts/WenEMYKKGT11
%A Wen, Xiaoqing
%A Enokimoto, Kazunari
%A Miyase, Kohei
%A Yamato, Yuta
%A Kochte, Michael A.
%A Kajihara, Seiji
%A Girard, Patrick
%A Tehranipoor, Mohammad
%B VTS
%D 2011
%I IEEE Computer Society
%K dblp
%P 166-171
%T Power-aware test generation with guaranteed launch safety for at-speed scan testing.
%U http://dblp.uni-trier.de/db/conf/vts/vts2011.html#WenEMYKKGT11
%@ 978-1-61284-657-6
@inproceedings{conf/vts/WenEMYKKGT11,
added-at = {2011-08-09T00:00:00.000+0200},
author = {Wen, Xiaoqing and Enokimoto, Kazunari and Miyase, Kohei and Yamato, Yuta and Kochte, Michael A. and Kajihara, Seiji and Girard, Patrick and Tehranipoor, Mohammad},
biburl = {https://www.bibsonomy.org/bibtex/2fdcab1c527a065cf8176217c94b2b239/dblp},
booktitle = {VTS},
crossref = {conf/vts/2011},
ee = {http://dx.doi.org/10.1109/VTS.2011.5783778},
interhash = {86908e054d681415c4f052d8f9fb1078},
intrahash = {fdcab1c527a065cf8176217c94b2b239},
isbn = {978-1-61284-657-6},
keywords = {dblp},
pages = {166-171},
publisher = {IEEE Computer Society},
timestamp = {2016-09-07T11:36:43.000+0200},
title = {Power-aware test generation with guaranteed launch safety for at-speed scan testing.},
url = {http://dblp.uni-trier.de/db/conf/vts/vts2011.html#WenEMYKKGT11},
year = 2011
}