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Power-aware test generation with guaranteed launch safety for at-speed scan testing.

X. Wen, K. Enokimoto, K. Miyase, Y. Yamato, M. Kochte, S. Kajihara, P. Girard, and M. Tehranipoor. VTS, page 166-171. IEEE Computer Society, (2011)

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Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Trusted fingerprint localization for multimedia devices based on blockchain.Z. Guan, Z. Liu, X. Wen, Q. Wan, and W. Xu. Inf. Sci., (2023)Design of True Random Number Generator Based on Multi-Ring Convergence Oscillator Using Short Pulse Enhanced Randomness.T. Ni, Q. Peng, J. Bian, L. Yao, Z. Huang, A. Yan, S. Wang, and X. Wen. IEEE Trans. Circuits Syst. I Regul. Pap., 70 (12): 5074-5085 (December 2023)Fortune: A New Fault-Tolerance TSV Configuration in Router-Based Redundancy Structure.Q. Xu, H. Geng, T. Ni, S. Chen, B. Yu, Y. Kang, and X. Wen. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (10): 3182-3187 (2022)Design of Radiation Hardened Latch and Flip-Flop with Cost-Effectiveness for Low-Orbit Aerospace Applications.A. Yan, A. Cao, Z. Xu, J. Cui, T. Ni, P. Girard, and X. Wen. J. Electron. Test., 37 (4): 489-502 (2021)At-Speed Logic BIST for IP CoresB. Cheon, E. Lee, L. Wang, X. Wen, P. Hsu, J. Cho, J. Park, H. Chao, and S. Wu. CoRR, (2007)GPU-Accelerated Estimation and Targeted Reduction of Peak IR-Drop during Scan Chain Shifting.S. Shi, S. Holst, and X. Wen. IEICE Trans. Inf. Syst., 106 (10): 1694-1704 (October 2023)SCLCRL: Shuttling C-elements based Low-Cost and Robust Latch Design Protected against Triple Node Upsets in Harsh Radiation Environments.A. Yan, Z. Li, S. Huang, Z. Zhai, X. Cheng, J. Cui, T. Ni, X. Wen, and P. Girard. DATE, page 1257-1262. IEEE, (2022)Single-Event Double-Upset Self-Recoverable and Single-Event Transient Pulse Filterable Latch Design for Low Power Applications.A. Yan, Y. Hu, J. Song, and X. Wen. DATE, page 1679-1684. IEEE, (2019)Novel Quadruple Cross-Coupled Memory Cell Designs With Protection Against Single Event Upsets and Double-Node Upsets.A. Yan, J. Zhou, Y. Hu, J. Cui, Z. Huang, P. Girard, and X. Wen. IEEE Access, (2019)Efficient Guided-Probe Fault Location Method for Sequential Circuits.X. Wen, K. Kinoshita, H. Tamamoto, and H. Yokoyama. IEICE Trans. Inf. Syst., 78-D (2): 122-129 (1995)

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Disambiguation of "Wen, Xiaoqing"

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Power-aware test generation with guaranteed launch safety for at-speed scan testing.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Wen, Xiaoqing"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Power-aware test generation with guaranteed launch safety for at-speed scan testing.

Please choose a person to relate this publication to

Xiaoqing Pan

Xiaoqing Liu

Xiaoqing Li

Xiaoqing Shen

Xiaoqing Jin

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Power-aware test generation with guaranteed launch safety for at-speed scan testing.