%0 Conference Paper %1 conf/irps/SunLXLWZJWH23 %A Sun, Zixuan %A Lu, Haoran %A Xue, Yongkang %A Luo, Wenpu %A Wang, Zirui %A Zhang, Jiayang %A Ji, Zhigang %A Wang, Runsheng %A Huang, Ru %B IRPS %D 2023 %I IEEE %K dblp %P 1-6 %T Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SunLXLWZJWH23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/SunLXLWZJWH23, added-at = {2023-09-30T00:00:00.000+0200}, author = {Sun, Zixuan and Lu, Haoran and Xue, Yongkang and Luo, Wenpu and Wang, Zirui and Zhang, Jiayang and Ji, Zhigang and Wang, Runsheng and Huang, Ru}, biburl = {https://www.bibsonomy.org/bibtex/2759c2708dd94a7a59ccc5cfaad024b40/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117840}, interhash = {9b86d381946780afbbf25901724cb024}, intrahash = {759c2708dd94a7a59ccc5cfaad024b40}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T12:18:52.000+0200}, title = {Investigation of Hot Carrier Enhanced Body Bias Effect in Advanced FinFET Technology.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#SunLXLWZJWH23}, year = 2023 }