Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/3dic/SonedaHYL19
%A Soneda, Hanna
%A Hashizume, Masaki
%A Yotsuyanagi, Hiroyuki
%A Lu, Shyue-Kung
%B 3DIC
%D 2019
%I IEEE
%K dblp
%P 1-5
%T Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes.
%U http://dblp.uni-trier.de/db/conf/3dic/3dic2019.html#SonedaHYL19
%@ 978-1-7281-4870-0
@inproceedings{conf/3dic/SonedaHYL19,
added-at = {2020-04-19T00:00:00.000+0200},
author = {Soneda, Hanna and Hashizume, Masaki and Yotsuyanagi, Hiroyuki and Lu, Shyue-Kung},
biburl = {https://www.bibsonomy.org/bibtex/220d1ddf27b13faf3dcc022eddc41d1be/dblp},
booktitle = {3DIC},
crossref = {conf/3dic/2019},
ee = {https://doi.org/10.1109/3DIC48104.2019.9058777},
interhash = {a148112cd3800f4a7d2563ea06268e92},
intrahash = {20d1ddf27b13faf3dcc022eddc41d1be},
isbn = {978-1-7281-4870-0},
keywords = {dblp},
pages = {1-5},
publisher = {IEEE},
timestamp = {2020-04-21T11:41:02.000+0200},
title = {Electrical Field Test Method of Resistive Open Defects between Dies by Quiescent Currents through Embedded Diodes.},
url = {http://dblp.uni-trier.de/db/conf/3dic/3dic2019.html#SonedaHYL19},
year = 2019
}