%0 Journal Article %1 journals/et/TakamatsuK90 %A Takamatsu, Yuzo %A Kinoshita, Kozo %D 1990 %J J. Electron. Test. %K dblp %N 3 %P 183-189 %T Extended selection of switching target faults in CONT algorithm for test generation. %U http://dblp.uni-trier.de/db/journals/et/et1.html#TakamatsuK90 %V 1

@article{journals/et/TakamatsuK90, added-at = {2020-09-11T00:00:00.000+0200}, author = {Takamatsu, Yuzo and Kinoshita, Kozo}, biburl = {https://www.bibsonomy.org/bibtex/24e674a75b082015a87c95dc13df50416/dblp}, ee = {https://doi.org/10.1007/BF00153855}, interhash = {b9961188c827abf59feff42f486ecb0e}, intrahash = {4e674a75b082015a87c95dc13df50416}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 3, pages = {183-189}, timestamp = {2020-09-12T11:40:20.000+0200}, title = {Extended selection of switching target faults in CONT algorithm for test generation.}, url = {http://dblp.uni-trier.de/db/journals/et/et1.html#TakamatsuK90}, volume = 1, year = 1990 }