%0 Journal Article %1 journals/tvlsi/ArumiRF16a %A Arumí, Daniel %A Rodríguez-Montañés, Rosa %A Figueras, Joan %D 2016 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 5 %P 1739-1748 %T Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#ArumiRF16a %V 24

@article{journals/tvlsi/ArumiRF16a, added-at = {2020-03-11T00:00:00.000+0100}, author = {Arumí, Daniel and Rodríguez-Montañés, Rosa and Figueras, Joan}, biburl = {https://www.bibsonomy.org/bibtex/2488c2c2fc4f27e25b5250baebb4ac97c/dblp}, ee = {https://doi.org/10.1109/TVLSI.2015.2477103}, interhash = {c27c6b1c8348dce291ef6855d276b32e}, intrahash = {488c2c2fc4f27e25b5250baebb4ac97c}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 5, pages = {1739-1748}, timestamp = {2020-03-12T11:44:43.000+0100}, title = {Test Escapes of Stuck-Open Faults Caused by Parasitic Capacitances and Leakage Currents.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi24.html#ArumiRF16a}, volume = 24, year = 2016 }