Inproceedings,
Delay Fault Test Generation with Cellular Automata.
S. Nandi, V. Boppana, S. Chakraborty, P. Chaudhuri, and S. Roy.VLSI Design, page 281-286. IEEE Computer Society, (1993)
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- conf/vlsid/NandiBCCR93
- entry type
- inproceedings
- booktitle
- VLSI Design
- year
- 1993
- pages
- 281-286
- publisher
- IEEE Computer Society
- crossref
- conf/vlsid/1993
- ee
- https://doi.ieeecomputersociety.org/10.1109/ICVD.1993.669697
- isbn
- 0-8186-3180-5
- url
- http://dblp.uni-trier.de/db/conf/vlsid/vlsid1993.html#NandiBCCR93
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- please select -%0 Conference Paper
%1 conf/vlsid/NandiBCCR93
%A Nandi, Sukumar
%A Boppana, Vamsi
%A Chakraborty, Supratik
%A Chaudhuri, Parimal Pal
%A Roy, Samir
%B VLSI Design
%D 1993
%I IEEE Computer Society
%K dblp
%P 281-286
%T Delay Fault Test Generation with Cellular Automata.
%U http://dblp.uni-trier.de/db/conf/vlsid/vlsid1993.html#NandiBCCR93
%@ 0-8186-3180-5
@inproceedings{conf/vlsid/NandiBCCR93,
added-at = {2023-03-24T00:00:00.000+0100},
author = {Nandi, Sukumar and Boppana, Vamsi and Chakraborty, Supratik and Chaudhuri, Parimal Pal and Roy, Samir},
biburl = {https://www.bibsonomy.org/bibtex/2acfdfb7ddce50469f9583c0e83e32f7c/dblp},
booktitle = {VLSI Design},
crossref = {conf/vlsid/1993},
ee = {https://doi.ieeecomputersociety.org/10.1109/ICVD.1993.669697},
interhash = {ce63a474f2b155b4bd9b2415cfbe2b77},
intrahash = {acfdfb7ddce50469f9583c0e83e32f7c},
isbn = {0-8186-3180-5},
keywords = {dblp},
pages = {281-286},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T05:46:57.000+0200},
title = {Delay Fault Test Generation with Cellular Automata.},
url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid1993.html#NandiBCCR93},
year = 1993
}