%0 Journal Article %1 journals/tcad/PendurkarTC99 %A Pendurkar, Rajesh %A Tovey, Craig A. %A Chatterjee, Abhijit %D 1999 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 8 %P 1178-1191 %T Single-probe traversal optimization for testing of MCM substrate interconnections. %U http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#PendurkarTC99 %V 18

@article{journals/tcad/PendurkarTC99, added-at = {2020-09-24T00:00:00.000+0200}, author = {Pendurkar, Rajesh and Tovey, Craig A. and Chatterjee, Abhijit}, biburl = {https://www.bibsonomy.org/bibtex/205afe78f08dd6a6e6683f7d76332b597/dblp}, ee = {https://doi.org/10.1109/43.775636}, interhash = {e61d65de7920316483586cdba58a5c4f}, intrahash = {05afe78f08dd6a6e6683f7d76332b597}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 8, pages = {1178-1191}, timestamp = {2020-09-25T11:46:00.000+0200}, title = {Single-probe traversal optimization for testing of MCM substrate interconnections.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad18.html#PendurkarTC99}, volume = 18, year = 1999 }