%0 Conference Paper %1 conf/ats/YeKLW16 %A Ye, Jin-Cun %A Kochte, Michael A. %A Lee, Kuen-Jong %A Wunderlich, Hans-Joachim %B ATS %D 2016 %I IEEE Computer Society %K dblp %P 215-220 %T Autonomous Testing for 3D-ICs with IEEE Std. 1687. %U http://dblp.uni-trier.de/db/conf/ats/ats2016.html#YeKLW16 %@ 978-1-5090-3809-1

@inproceedings{conf/ats/YeKLW16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ye, Jin-Cun and Kochte, Michael A. and Lee, Kuen-Jong and Wunderlich, Hans-Joachim}, biburl = {https://www.bibsonomy.org/bibtex/2f63f5243271a6435bb0f0777916fc8c9/dblp}, booktitle = {ATS}, crossref = {conf/ats/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2016.56}, interhash = {e6b8764c8460f98437a64889d8f91cc5}, intrahash = {f63f5243271a6435bb0f0777916fc8c9}, isbn = {978-1-5090-3809-1}, keywords = {dblp}, pages = {215-220}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:46.000+0200}, title = {Autonomous Testing for 3D-ICs with IEEE Std. 1687.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2016.html#YeKLW16}, year = 2016 }